Distributed Learning for Automatic Modulation Classification in Edge Devices.
Yu WangLiang GuoYu ZhaoJie YangBamidele AdebisiHaris GacaninGuan GuiPublished in: IEEE Wirel. Commun. Lett. (2020)
Keyphrases
- distributed learning
- pattern recognition
- support vector machine
- classification accuracy
- classification method
- feature extraction
- feature vectors
- pattern classification
- classification algorithm
- image classification
- statistical classification
- classification scheme
- automatic classification
- collaborative learning
- feature selection
- text classification
- edge detection
- model selection
- machine learning
- feature set
- classification models
- feature space
- support vector
- edge information
- learning algorithm