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Analysis of electrical parameters of organic thin film transistors based on thickness variation in semiconducting and dielectric layers.

Brijesh KumarBrajesh Kumar KaushikYuvraj Singh Negi
Published in: IET Circuits Devices Syst. (2014)
Keyphrases
  • thin film
  • high density
  • film thickness
  • short circuit
  • multi layer
  • chemical vapor deposition
  • database
  • genetic algorithm
  • knowledge discovery