Test challenges in nanometer technologies.
Sandip KunduSanjay SenguptaRajesh GalivanchePublished in: ETW (2000)
Keyphrases
- key issues
- lessons learned
- real world
- test data
- future trends
- emerging technologies
- open issues
- ubiquitous and pervasive
- driving forces
- enabling technologies
- advanced technologies
- legal issues
- human factors
- artificial intelligence
- neural network
- challenges facing
- enterprise search
- application scenarios
- design principles
- innovative approaches
- database