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A Technique for Improving the Noise-Equivalent-Displacement of SM-SLD Interferometers for Industrial Processes.
Ettore Masetti
Luigi Rovati
Stefano Cattini
Published in:
RTSI (2021)
Keyphrases
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industrial processes
industrial process
fault detection
quality improvement
fault detection and isolation
welding process
noise level
neural network
genetic algorithm
computer vision
optical flow
missing data
radial basis function
noisy data
signal to noise ratio