Improving Collaborative Metric Learning with Efficient Negative Sampling.
Viet-Anh TranRomain HennequinJimena Royo-LetelierManuel MoussallamPublished in: CoRR (2019)
Keyphrases
- metric learning
- distance metric
- feature space
- pairwise
- semi supervised
- dimensionality reduction
- data sets
- machine learning and pattern recognition
- distance metric learning
- kernel matrix
- random sampling
- learning tasks
- multi task
- machine learning
- active learning
- learning styles
- high dimensional
- semi supervised clustering
- pattern recognition
- image processing