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Laser decapsulation of plastic packages for failure analysis: Process control and artefact investigations.
A. Aubert
Lionel Dantas de Morais
J. P. Rebrasse
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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process control
control system
neural network
machine learning
genetic algorithm
computer vision
knowledge base
clustering algorithm
three dimensional
similarity measure
data analysis
quantitative analysis
failure rate