A Non-Scan DFT Method for Controllers to Achieve Complete Fault Efficiency.
Satoshi OhtakeToshimitsu MasuzawaHideo FujiwaraPublished in: Asian Test Symposium (1998)
Keyphrases
- experimental evaluation
- high efficiency
- synthetic data
- dynamic programming
- high accuracy
- computational efficiency
- high precision
- decision trees
- highly efficient
- detection method
- clustering method
- theoretical analysis
- computationally efficient
- cost function
- significant improvement
- pairwise
- objective function
- similarity measure
- genetic algorithm
- support vector machine
- fuzzy logic
- probabilistic model
- image quality
- optimization algorithm
- detection algorithm
- control system
- preprocessing
- computational complexity