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Retention-Aware DRAM Assembly and Repair for Future FGR Memories.
Ying Wang
Yinhe Han
Cheng Wang
Huawei Li
Xiaowei Li
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
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long term
high density
database
information systems
predicting future
real time
databases
management system
associative memory
current status