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Retention-Aware DRAM Assembly and Repair for Future FGR Memories.

Ying WangYinhe HanCheng WangHuawei LiXiaowei Li
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
  • long term
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  • predicting future
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  • management system
  • associative memory
  • current status