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Thermal aware cell-based full-chip electromigration reliability analysis.
Syed M. Alam
Donald E. Troxel
Carl V. Thompson
Published in:
ACM Great Lakes Symposium on VLSI (2005)
Keyphrases
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reliability analysis
power plant
high speed
low cost
infrared
single chip
high density
fault tree
real world
machine learning
case study
data analysis
soft computing
optimization model