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Tolerating Retention Failures in Neuromorphic Fabric based on Emerging Resistive Memories.

Christopher MünchRajendra BishnoiMehdi Baradaran Tahoori
Published in: ASP-DAC (2020)
Keyphrases
  • data mining
  • database
  • failure detection
  • long term
  • cognitive load
  • clustering algorithm
  • associative memory
  • failure rate
  • neural network
  • artificial intelligence
  • decision making
  • content addressable