Low-cost DC BIST for analog circuits: A case study.

Pablo A. Petrashin Carlos Dualibe Walter J. Lancioni Luis E. Toledo

Published in: LATW (2013)

Keyphrases

analog circuits
low cost
fault diagnosis
digital circuits
low power
neural network
wavelet packet transform
case study
digital camera
test bed
real time
single chip
expert systems
highly efficient
embedded systems
image processing
computer vision
artificial intelligence
data mining
active power filter