Oscillation and Transition Tests for Synchronous Sequential Circuits.

Katherine Shu-Min Li

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2013)

Keyphrases

high speed
delay insensitive
search algorithm
test cases
analog circuits
asynchronous communication
sequential search
transition model
analog vlsi
databases
real world
machine learning
multiscale
sequential data
electronic circuits