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Estimation of defocus and astigmatism in transmission electron microscopy.

M. VulovicP. L. BrandtR. B. G. RavelliA. J. KosterLucas J. van VlietBernd Rieger
Published in: ISBI (2010)
Keyphrases
  • transmission electron microscopy
  • x ray
  • estimation accuracy
  • high resolution
  • density estimation
  • estimation error
  • three dimensional
  • image registration
  • estimation process
  • electron microscopy