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Estimation of defocus and astigmatism in transmission electron microscopy.
M. Vulovic
P. L. Brandt
R. B. G. Ravelli
A. J. Koster
Lucas J. van Vliet
Bernd Rieger
Published in:
ISBI (2010)
Keyphrases
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transmission electron microscopy
x ray
estimation accuracy
high resolution
density estimation
estimation error
three dimensional
image registration
estimation process
electron microscopy