Login / Signup

Testability of Circuits Derived from Lattice Diagrams.

Rolf DrechslerWolfgang GüntherBernd Becker
Published in: EUROMICRO (2000)
Keyphrases
  • artificial intelligence
  • neural network
  • high speed
  • lattice structure
  • machine learning
  • genetic algorithm
  • analog circuits
  • asynchronous circuits