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A novel crowdsourcing platform for microelectronics counterfeit defect detection.
Bahar Ahmadi
Pouya Tavousi
Joseph Favata
Peiman Shahbeigi-Roodposhti
Rengarajan Pelapur
Sina Shahbazmohamadi
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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defect detection
feature extraction
automated visual inspection
real time
platform independent
information systems
metadata
three dimensional
textured surfaces
crowd sourced