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Limitations on Testable Affine-Invariant Codes in the High-Rate Regime.
Venkatesan Guruswami
Madhu Sudan
Ameya Velingker
Carol Wang
Published in:
Electron. Colloquium Comput. Complex. (2014)
Keyphrases
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affine invariant
high rate
low rate
affine transformation
false alarms
scale invariant
multiscale
contour matching
affine invariance
object matching
fourier descriptors
affine transform
feature detectors
convex hull
curve matching
computer vision
feature extraction