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Data-Driven Insights on Time-to-Failure of Electromechanical Manufacturing Devices: A Procedure and Case Study.
Fernando Castaño
Yarens J. Cruz
Alberto Villalonga
Rodolfo E. Haber
Published in:
IEEE Trans. Ind. Informatics (2023)
Keyphrases
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data driven
case study
data mining
mobile devices
software development
quality control
product design
semiconductor manufacturing
information systems
knowledge management
design process
lessons learned
embedded systems
personal computer
failure prediction
concurrent engineering