Memory testing with a RISC microcontroller.

Ad J. van de Goor Georgi Gaydadjiev Said Hamdioui

Published in: DATE (2010)

Keyphrases

low cost
application specific
memory usage
computational power
multiscale
test cases
learning algorithm
design considerations
random access
memory requirements
software engineering
image segmentation
data sets
limited memory
memory size
instruction set
low power consumption