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Characterization of defects in flexible circuits with ultrasonic atomic force microscopy.

Vijayaraghava NalladegaShamachary SathishAmarjit S. Brar
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • atomic force microscopy
  • neural network
  • e learning
  • hidden markov models
  • high speed
  • machine learning
  • circuit design
  • defect detection
  • electronic circuits
  • vlsi circuits