Evolution of oxide charge trapping under bias temperature stressing.

Diing Shenp Ang Chenjie Gu Z. Y. Tung A. A. Boo Yuan Gao

Published in: Microelectron. Reliab. (2014)

Keyphrases

room temperature
metal oxide
data sets
temporal evolution
high temperature
database
software evolution
real time
databases
neural network
data mining
expert systems
artificial neural networks
wireless sensor networks