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A Holistic Analysis of Circuit Performance Variations in 3-D ICs With Thermal and TSV-Induced Stress Considerations.
Sravan K. Marella
Sachin S. Sapatnekar
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
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machine learning
statistical analysis
database
data sets
genetic algorithm
low cost
high speed
infrared
digital circuits