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Built-In Test of Switched-Mode Power Converters: Avoiding DUT Damage Using Alternative Safe Measurements.

Xian WangBlanchard KenfackEstella SilvaAbhijit Chatterjee
Published in: Asian Test Symposium (2013)
Keyphrases
  • test data
  • power consumption
  • multiscale
  • test suite
  • measured data
  • artificial intelligence
  • knowledge base
  • multi agent systems
  • long term
  • computational power
  • damage assessment
  • power electronics