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Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs.

Ninoslav StojadinovicIvica ManicSnezana Djoric-VeljkovicVojkan DavidovicSnezana GolubovicSima Dimitrijev
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • electric field
  • x ray
  • space charge
  • power consumption
  • small size
  • external force
  • power distribution
  • information systems
  • infrared
  • low variance
  • real time