Login / Signup

Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard.

Gladys Omayra DucoudrayJaime Ramírez-Angulo
Published in: J. Electron. Test. (2003)
Keyphrases
  • built in self test
  • mixed signal
  • low power
  • integrated circuit
  • high speed
  • multi channel
  • vlsi circuits
  • fault diagnosis
  • single chip
  • multimedia
  • model based diagnosis