High Test Quality in Low Pin Count Applications.
Jayant D'SouzaSubramanian MahadevanNilanjan MukherjeeGraham RhodesJocelyn MoreauThomas DroniouPaul ArmagnatDamien SartorettiPublished in: ITC (2008)
Keyphrases
- high levels
- high rate
- high quality
- wide range
- significantly lower
- small size
- low quality
- high precision
- high sensitivity
- decision making
- quality assessment
- test cases
- hidden markov models
- quality control
- quality measures
- image quality
- database
- bayesian networks
- training data
- decision trees
- information systems
- information retrieval
- real world
- neural network
- databases
- data sets