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A New Bare Die Test Methodology.

Zao YangKwang-Ting ChengK. L. Tai
Published in: VTS (1999)
Keyphrases
  • neural network
  • database
  • theoretical framework
  • data sets
  • databases
  • machine learning
  • image processing
  • digital libraries
  • test cases
  • test data
  • statistical significance