Domain Transfer for Surface Defect Detection using Few-Shot Learning on Scarce Data.
Felix GerschnerJonas PaulLukas SchmidNico BarthelVictor GouromichosFlorian SchmidMartin AtzmuellerAndreas TheisslerPublished in: INDIN (2023)
Keyphrases
- prior knowledge
- data analysis
- data collection
- data structure
- defect detection
- learning algorithm
- synthetic data
- data quality
- data sources
- experimental data
- data sets
- high quality
- learning systems
- previously learned
- online learning
- domain independent
- background knowledge
- data processing
- database
- input data
- knowledge discovery
- reinforcement learning
- training data
- image processing
- high dimensional data
- data mining techniques
- domain experts
- supervised learning
- probability distribution
- raw data
- learning models
- knowledge transfer
- transfer knowledge