Classification of bridging faults in CMOS circuits: experimental results and implications for test.
Scott F. MidkiffS. Wayne BollingerPublished in: VTS (1993)
Keyphrases
- pattern recognition
- high speed
- classification accuracy
- real world
- experimental design
- feature vectors
- decision trees
- classification scheme
- delay insensitive
- classification systems
- decision rules
- test cases
- text classification
- image classification
- support vector machine
- feature selection
- preprocessing
- data sets
- low cost
- supervised learning
- support vector machine svm
- class labels
- automatic classification
- training set
- expert systems
- test suite
- circuit design
- support vector