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Accurate and Fast On-Wafer Test Circuitry for Device Array Characterization in Wafer Acceptance Test.
Hao-Chiao Hong
Long-Yi Lin
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2019)
Keyphrases
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test cases
semiconductor manufacturing
genetic algorithm
test data
integrated circuit
databases
information retrieval
information systems
high quality
relational databases
low cost
massively parallel
structural equation modeling