Login / Signup

Correlating gate sinking and electrical performance of pseudomorphic high electron mobility transistors.

Ronen A. BerechmanBoris RevzinYoram Shapira
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • wide range
  • electrical properties
  • mobile agents
  • integrated circuit
  • transmission line
  • cmos technology
  • genetic algorithm
  • high precision
  • database
  • neural network
  • case study
  • high density