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Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction.

Linfeng ChenAijiao CuiChip-Hong Chang
Published in: IEEE Trans. Computers (2015)
Keyphrases
  • design process
  • optimal design
  • databases
  • real world
  • learning algorithm
  • artificial intelligence
  • knowledge base
  • multiscale
  • statistical tests