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Comparison in radiation tolerance between FLR planar junction termination and positive bevel edge termination for power diodes.
Xinfang Liao
Yi Liu
Changqing Xu
Chen Wang
Yintang Yang
Published in:
Microelectron. J. (2022)
Keyphrases
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rewrite systems
infrared
gallium arsenide
active rules
term rewriting
x ray
power consumption
positive and negative
data sets
augmented reality
range images
type checking
termination analysis