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Comparison in radiation tolerance between FLR planar junction termination and positive bevel edge termination for power diodes.

Xinfang LiaoYi LiuChangqing XuChen WangYintang Yang
Published in: Microelectron. J. (2022)
Keyphrases
  • rewrite systems
  • infrared
  • gallium arsenide
  • active rules
  • term rewriting
  • x ray
  • power consumption
  • positive and negative
  • data sets
  • augmented reality
  • range images
  • type checking
  • termination analysis