STAR-ATPG: a high speed test pattern generator for large scan designs.

Kuo-Hui Tsai Tompson Janusz Rajski Malgorzata Marek-Sadowska

Published in: ITC (1999)

Keyphrases

pattern generator
high speed
real time
databases
data mining
computer vision
high speed networks
database
machine learning
information systems
low cost