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Electromigration behavior in Cu/Ni-P/Sn-Cu based joint system with low current density.

Takuya KadoguchiKeisuke GotouKimihiro YamanakaShijo NagaoKatsuaki Suganuma
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • electron microscopy
  • mechanical properties
  • low energy
  • computer vision
  • expert systems
  • behavior patterns
  • e learning
  • cooperative
  • relational databases
  • human behavior