Cost-Sensitive Deep Metric Learning for Fine-Grained Image Classification.
Junjie ZhaoYuxin PengPublished in: MMM (1) (2018)
Keyphrases
- fine grained
- cost sensitive
- image classification
- metric learning
- distance metric learning
- multi label
- coarse grained
- multi class
- misclassification costs
- distance metric
- semi supervised
- pairwise
- learning tasks
- active learning
- dimensionality reduction
- binary classification
- access control
- naive bayes
- multi task
- feature extraction
- image features
- feature space
- distance function
- higher order
- support vector machine
- semi supervised learning
- decision trees
- feature selection
- data sets
- pattern recognition
- boosting algorithms
- machine learning