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Characterizing parameter variations for enhanced performance and adaptability in 3 nm MBCFET technology.

Mahmood RafieeNabiollah ShiriMohsen GharehkhaniAlexandra Pinto CastellanosAyoub Sadeghi
Published in: Microelectron. J. (2024)
Keyphrases
  • rapid development
  • technological advances
  • cmos technology
  • parameter values
  • key technologies
  • computer vision
  • decision making
  • image processing
  • case study
  • evolutionary algorithm
  • cost effective