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On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit.
Amlan Ghosh
Rahul M. Rao
Jae-Joon Kim
Ching-Te Chuang
Richard B. Brown
Published in:
VLSI Design (2008)
Keyphrases
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high speed
real time
false positives
detection rate
analog vlsi
case study
video sequences
evolutionary algorithm
low cost
detection algorithm
detection method
development process
low power
detection accuracy
circuit design
printed circuit boards