Progress in the Correlative Atomic Force Microscopy and Optical Microscopy.
Lulu ZhouMingjun CaiTi TongHongda WangPublished in: Sensors (2017)
Keyphrases
- atomic force microscopy
- high throughput
- image analysis
- long period
- microscopy images
- charge coupled device
- fluorescence microscopy
- expert systems
- real time
- spatial correlation
- image enhancement
- light scattering
- atmospheric turbulence
- high resolution
- multiscale
- three dimensional
- image processing
- information systems
- machine learning
- data sets