H-SCAN: A high level alternative to full-scan testing with reduced area and test application overheads.

Subhrajit Bhattacharya Sujit Dey

Published in: VTS (1996)

Keyphrases

high level
test cases
hardware software co design
low level
test data
programming language
scan data
test data generation
binary images
orders of magnitude
medical images
database
bayesian networks
training data
case study
machine learning
data sets