A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous Memory Interfaces.
Hyunjin KimJacob A. AbrahamPublished in: Asian Test Symposium (2010)
Keyphrases
- high speed
- low cost
- low power
- gigabit ethernet
- real time
- power dissipation
- built in self test
- data acquisition
- shift register
- logic circuits
- integrated circuit
- memory requirements
- single chip
- high speed networks
- computing power
- digital camera
- limited memory
- frame rate
- user interface
- memory usage
- hardware and software
- low memory
- circuit design
- neural network
- databases
- interface design
- embedded systems
- focal plane
- memory size
- main memory
- expert systems
- learning algorithm
- data sets