Yield Enhancement with Particle Defects Reduction.

Kiyoshi Mori Nam T. Nguyen Dewey Keeton Ross Burns

Published in: DFT (1994)

Keyphrases

image enhancement
image processing
defect detection
databases
digital libraries
neural network
genetic algorithm
artificial intelligence
metadata
case study
multi agent
data structure
color images
probabilistic model
contrast enhancement
defect classification