Storage-Based Built-In Self-Test for Gate-Exhaustive Faults.

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2021)

Keyphrases

built in self test
integrated circuit
data storage
storage and retrieval
random access
mass storage
multiple input
efficient storage
storage management
storage requirements
case study
flash memory
solid state
storage space
data structure
artificial intelligence
real time