Login / Signup
SRAM Leakage Reduction by Row/Column Redundancy Under Random Within-Die Delay Variation.
Maziar Goudarzi
Tohru Ishihara
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
</>
row column
data transmission
power consumption
fast fourier transform
leakage current
multiresolution
high frequency
high order