A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes.
Dicle OzisTerri S. FiezKartikeya MayaramPublished in: CICC (2002)
Keyphrases
- random noise
- power consumption
- three dimensional
- noise reduction
- signal to noise ratio
- noise model
- noisy data
- high speed
- noise level
- gaussian noise
- low cost
- image processing
- process model
- missing data
- statistically independent
- geometric information
- harmonic maps
- neural network
- power supply
- noise free
- additive noise
- geometric constraints
- low power