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Semiconductor Component Fault Assessment and Probability Impact Estimation on Application Level.
Jonas Stricker
Clemens Kain
Jérôme Kirscher
Andi Buzo
Linus Maurer
Georg Pelz
Published in:
NORCAS (2018)
Keyphrases
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application level
operating system
network management
probability distribution
quality of service
network services
virtual machine
fault diagnosis
fault detection
bottle neck
real time
machine learning
metadata
data processing
semiconductor manufacturing