Fourth-Order Reference Trajectories in Lithography Stages with Weakly-Damped Modes - a Frequency-Domain Perspective.
Marcel HeertjesJazmin Zenteno TorresMohammad Al JanaidehPublished in: CDC (2023)
Keyphrases
- frequency domain
- fourth order
- noise removal
- denoising
- spatial domain
- fourier transform
- high order
- partial differential equations
- image interpolation
- cross correlation
- anisotropic diffusion
- nonlinear diffusion
- feature extraction
- high quality
- filter bank
- subband
- power spectra
- image denoising
- noise reduction
- natural images
- estimation error
- higher order
- image data
- multiscale
- feature selection