High-Resolution Analog Measurement on Mixed-Signal LSI Tester.
Kohei AkiyamaHiroshi NishimuraKyoji AnazawaAkito KishidaNobuyuki KasugaPublished in: ITC (1989)
Keyphrases
- mixed signal
- high resolution
- low power
- multi channel
- vlsi circuits
- low resolution
- digital circuits
- high speed
- latent semantic indexing
- power consumption
- low cost
- cmos technology
- super resolution
- image processing
- high quality
- low voltage
- remote sensing
- vector space
- single chip
- digital signal processing
- analog to digital converter
- field of view
- text retrieval
- machine vision
- complex systems
- wireless sensor networks
- pattern recognition
- computer vision