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Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications.
L. Ludwig
Elena P. Sapozhnikova
V. P. Lunin
Wolfgang Rosenstiel
Published in:
Neural Comput. Appl. (2000)
Keyphrases
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prediction error
support vector machine svm
classification accuracy
decision trees
pattern recognition
machine learning
pattern classification
support vector machine
classification scheme
classification algorithm
prediction accuracy
prediction model
classification systems
neyman pearson
neural networks and support vector machines
general loss functions
cross validation
automatic classification
high density
classification models
root mean square error
data sets
error rate
text classification
classification method
support vector
feature extraction
feature vectors
data mining
nearest neighbour algorithm
feature selection
case study
target variable
feature space
high speed
image classification
cost sensitive
error bounds