Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications.
L. LudwigElena P. SapozhnikovaV. P. LuninWolfgang RosenstielPublished in: Neural Comput. Appl. (2000)
Keyphrases
- prediction error
- support vector machine svm
- classification accuracy
- decision trees
- pattern recognition
- machine learning
- pattern classification
- support vector machine
- classification scheme
- classification algorithm
- prediction accuracy
- prediction model
- classification systems
- neyman pearson
- neural networks and support vector machines
- general loss functions
- cross validation
- automatic classification
- high density
- classification models
- root mean square error
- data sets
- error rate
- text classification
- classification method
- support vector
- feature extraction
- feature vectors
- data mining
- nearest neighbour algorithm
- feature selection
- case study
- target variable
- feature space
- high speed
- image classification
- cost sensitive
- error bounds