A novel hypergraph convolution network for wafer defect patterns identification based on an unbalanced dataset.
Yuxi XieShaofan LiC. T. WuZhipeng LaiMiao SuPublished in: J. Intell. Manuf. (2024)
Keyphrases
- network structure
- wireless sensor networks
- database
- complex networks
- computer networks
- peer to peer
- benchmark datasets
- similar patterns
- communication patterns
- network architecture
- link prediction
- network traffic
- image processing
- neural network
- higher order
- communication networks
- pattern discovery
- control system
- network model
- integrated circuit
- network topologies
- defect detection
- input patterns
- data sets