Generalization in Metric Learning: Should the Embedding Layer be the Embedding Layer?
Nam N. VoJames HaysPublished in: CoRR (2018)
Keyphrases
- metric learning
- maximum variance unfolding
- distance metric
- dimensionality reduction
- nonlinear dimensionality reduction
- semi supervised
- machine learning and pattern recognition
- data sets
- pattern recognition
- prior knowledge
- learning tasks
- manifold learning
- feature selection
- kernel matrix
- distance metric learning
- laplacian eigenmaps